Description: Please refer to the section BELOW (and NOT ABOVE) this line for the product details - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Title:Applications Of Finite Element Methods For Reliability Studies On Ulsi InterconnectionsISBN13:9780857293091ISBN10:0857293095Author:Tan, Cher Ming (Author), Li, Wei (Author), Gan, Zhenghao (Author)Description:Applications Of Finite Element Methods For Reliability Studies On Ulsi Interconnections Provides A Detailed Description Of The Application Of Finite Element Methods (Fems) To The Study Of Ulsi Interconnect Reliability Over The Past Two Decades The Application Of Fems Has Become Widespread And Continues To Lead To A Much Better Understanding Of Reliability Physics To Help Readers Cope With The Increasing Sophistication Of Fems' Applications To Interconnect Reliability, Applications Of Finite Element Methods For Reliability Studies On Ulsi Interconnections Will: Introduce The Principle Of Fems;Review Numerical Modeling Of Ulsi Interconnect Reliability;Describe The Physical Mechanism Of Ulsi Interconnect Reliability Encountered In The Electronics Industry; Anddiscuss In Detail The Use Of Fems To Understand And Improve Ulsi Interconnect Reliability From Both The Physical And Practical Perspective, Incorporating The Monte Carlo Method A Full-Scale Review Of The Numerical Modeling Methodology Used In The Study Of Interconnect Reliability Highlights Useful And Noteworthy Techniques That Have Been Developed Recently Many Illustrations Are Used Throughout The Book To Improve The Reader's Understanding Of The Methodology And Its Verification Actual Experimental Results And Micrographs On Ulsi Interconnects Are Also Included Applications Of Finite Element Methods For Reliability Studies On Ulsi Interconnections Is A Good Reference For Researchers Who Are Working On Interconnect Reliability Modeling, As Well As For Those Who Want To Know More About Fems For Reliability Applications It Gives Readers A Thorough Understanding Of The Applications Of Fem To Reliability Modeling And An Appreciation Of The Strengths And Weaknesses Of Various Numerical Models For Interconnect Reliability Binding:Hardcover, HardcoverPublisher:SpringerPublication Date:2011-03-07Weight:0.8 lbsDimensions:0.6'' H x 9.2'' L x 6.1'' WNumber of Pages:152Language:English
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Book Title: Applications Of Finite Element Methods For Reliability Studi...
Item Length: 9.3in
Item Width: 6.1in
Author: Yuejin Hou, Wei Li, Zhenghao Gan, Cher Ming Tan
Publication Name: Applications of Finite Element Methods for Reliability Studies on Ulsi Interconnections
Format: Hardcover
Language: English
Publisher: Springer London, The Limited
Publication Year: 2011
Series: Springer Series in Reliability Engineering Ser.
Type: Textbook
Item Weight: 15.6 Oz
Number of Pages: VIII, 152 Pages
